• DocumentCode
    1681590
  • Title

    Active On-Die Suppression of Power Supply Noise

  • Author

    Keskin, Gökçe ; Li, Xin ; Pileggi, Larry

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA
  • fYear
    2006
  • Firstpage
    813
  • Lastpage
    816
  • Abstract
    An active on-chip circuit is demonstrated in 130nm CMOS for the suppression of on-chip power supply noise due to power distribution resonance. Testchip measurement results indicate up to 40% reduction in power supply noise during clock/power gating at a 2% power and 6% area overhead cost. Oscillation time is reduced by 50%. Simulation results show that comparable overshoot/undershoot and ringing control via on-chip decoupling would require significantly more area and power due to leakage, particularly at 90nm and below
  • Keywords
    CMOS integrated circuits; circuit oscillations; integrated circuit measurement; integrated circuit noise; integrated circuit testing; interference suppression; power supply circuits; 130 nm; CMOS process; active on-chip circuit; active on-die suppression; clock/power gating; on-chip decoupling; on-chip power supply noise; oscillation time; power distribution resonance; testchip measurement; Active noise reduction; Area measurement; Circuit noise; Circuit testing; Noise measurement; Power distribution; Power measurement; Power supplies; RLC circuits; Resonance; L.di/dt noise; damping and decoupling capacitor; power supply noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 2006. CICC '06. IEEE
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    1-4244-0075-9
  • Electronic_ISBN
    1-4244-0076-7
  • Type

    conf

  • DOI
    10.1109/CICC.2006.321012
  • Filename
    4115077