DocumentCode
1681668
Title
A systematic error analysis of HP 8510 time-domain gating techniques with experimental verification
Author
Lu, K. ; Brazil, T.J.
Author_Institution
Dept. of Eletron. & Electr. Eng., Univ. Coll. Dublin, Ireland
fYear
1993
Firstpage
1259
Abstract
The errors caused by using time-domain gating techniques on the HP 8510 automatic network analyzer are investigated systematically. These errors are divided into four categories: out-of-gate attenuation error, truncation error, masking error, and multireflection aliasing error. A method for estimating the order of the magnitude errors resulting from time-domain gating is presented. Experiments for supporting the analysis have been designed and carried out, giving results in good agreement with theory.<>
Keywords
error analysis; measurement errors; microwave measurement; network analysers; ANA; HP 8510; automatic network analyzer; error analysis; magnitude errors; masking error; multireflection aliasing error; out-of-gate attenuation error; time-domain gating techniques; truncation error; Attenuation; Distortion measurement; Educational institutions; Error analysis; Finite wordlength effects; Frequency measurement; Reflection; Time domain analysis; Transmission line discontinuities; Transmission line measurements;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1993., IEEE MTT-S International
Conference_Location
Atlanta, GA, USA
ISSN
0149-645X
Print_ISBN
0-7803-1209-0
Type
conf
DOI
10.1109/MWSYM.1993.277102
Filename
277102
Link To Document