A design method for embedded self-testing t-UED and BUED code checkers

Author

Tarnick, Steffen

Author_Institution

SATCOM GmbH, Teltow, Germany

fYear

2003

Firstpage

43

Lastpage

48

Abstract

A novel method for designing t-UED and BUED code checkers is presented. In particular we consider Borden codes for t = 2^k - 1, Bose and Bose-Lin codes. The design technique for all three checker types is mainly based on averaging weights and check symbol values of the code words. The checkers have a simple and regular structure that does not depend on the set of code words that is provided by the circuit under check. The checkers are very well suited for use as embedded checkers since they are self-testing with respect to single stuck-at faults and almost all combinational faults in a single cell under very weak assumptions. All three checker types can be tested with only 2 or 3 code words.

Keywords

automatic testing; embedded systems; error detection codes; integrated circuit testing; Borden code; Bose code; Bose-Lin code; averaging weights; check symbol values; circuit under check; code words; combinational faults; design method; design technique; embedded checkers; embedded self-testing BUED code checker; embedded self-testing t-UED code checker; on line testing technique; single cell; stuck-at faults; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Design methodology; Electrical fault detection; Fault detection; Monitoring; System testing; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

On-Line Testing Symposium, 2003. IOLTS 2003. 9th IEEE

Print_ISBN

0-7695-1968-7

Type

conf

DOI

10.1109/OLT.2003.1214365

Filename

1214365