• DocumentCode
    1681966
  • Title

    Ultra-high performance rugged scaled power MOSFETs for high-frequency power conversion

  • Author

    Fischer, Kevin ; Shenai, Krishna

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Illinois Univ., Chicago, IL, USA
  • Volume
    1
  • fYear
    1996
  • Firstpage
    270
  • Abstract
    The ruggedness and performance of ultra-high density low-voltage power MOSFETs are reported. It is shown that rugged power MOSFETs with ultra-high static and switching performance can be developed using scaled silicon technologies. The experimental results are supported with extensive numerical simulations which clearly show important physical effects as the technology is scaled
  • Keywords
    elemental semiconductors; power MOSFET; power conversion; power semiconductor switches; semiconductor materials; silicon; high-frequency power conversion; low-voltage power MOSFET; nonisothermal simulation; rugged scaled power MOSFET; silicon; ultra-high density; ultra-high static performance; ultra-high switching performance; unclamped inductive switching; Bipolar transistors; Circuit testing; Contact resistance; Inductors; MOSFETs; Numerical simulation; Power conversion; Silicon; Surface resistance; Switching circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition, 1996. APEC '96. Conference Proceedings 1996., Eleventh Annual
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7803-3044-7
  • Type

    conf

  • DOI
    10.1109/APEC.1996.500454
  • Filename
    500454