Title :
Memory built-in self-repair for nanotechnologies
Author :
Nicolaidis, M. ; Achouri, N. ; Anghel, L.
Author_Institution :
iRoC, Santa Clara, CA, USA
Abstract :
This paper presents memory built-in self-repair approaches allowing to achieve high yield for defect densities several orders of magnitude higher than in current technologies. Such repair schemes illustrate that we could build memories in nanoelectronic technologies that are subject to very high defect densities.
Keywords :
automatic testing; built-in self test; fault tolerance; integrated memory circuits; nanoelectronics; nanotechnology; defect densities; fault tolerance; memory built-in self-repair; nanoelectronic technologies; nanotechnolgies; Buildings; Circuit faults; Costs; Fault tolerance; Laboratories; Manufacturing; Nonvolatile memory; Performance evaluation; Taxonomy; Testing;
Conference_Titel :
On-Line Testing Symposium, 2003. IOLTS 2003. 9th IEEE
Print_ISBN :
0-7695-1968-7
DOI :
10.1109/OLT.2003.1214373
