Title :
Full two-port on-wafer vector network analysis to 120 GHz using active probes
Author :
Yu, R. ; Reddy, M. ; Pusl, J. ; Allen, S. ; Case, M. ; Rodwell, M.
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
Abstract :
A millimeter-wave full two-port on-wafer vector network analyzer (VNA) is implemented with monolithic GaAs directional time-domain reflectometer integrated circuits mounted directly on low-loss microwave wafer probes. The VNA performs S-parameter measurements to 120 GHz with +or- 0.2 dB repeatability using a line-reflect-match calibration method.<>
Keywords :
MMIC; S-parameters; calibration; integrated circuit testing; microwave reflectometry; network analysers; probes; time-domain reflectometry; GaAs; MMIC; S-parameter measurements; VNA; active probes; directional time-domain reflectometer; integrated circuits; line-reflect-match calibration method; low-loss microwave wafer probes; millimeter-wave; two-port onwafer network analysis; vector network analyzer; Gallium arsenide; MMICs; Microwave integrated circuits; Millimeter wave integrated circuits; Millimeter wave measurements; Millimeter wave technology; Monolithic integrated circuits; Performance evaluation; Probes; Time domain analysis;
Conference_Titel :
Microwave Symposium Digest, 1993., IEEE MTT-S International
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-1209-0
DOI :
10.1109/MWSYM.1993.277124
