DocumentCode :
16821
Title :
Signal-Integrity Optimization for Complicated Multiple-Input Multiple-Output Networks Based on Data Mining of S-Parameters
Author :
Mu-Shui Zhang ; Hong-Zhou Tan ; Jun-Fa Mao
Author_Institution :
Dept. of Electron. & Commun. Eng., Sun Yat-sen Univ., Guangzhou, China
Volume :
4
Issue :
7
fYear :
2014
fDate :
Jul-14
Firstpage :
1184
Lastpage :
1192
Abstract :
In this paper, an efficient signal-integrity analysis and optimization method for complicated multiple-input multiple-output (MIMO) networks is proposed, in which data mining is applied to discover the concealed information in black-box S-parameter models. Instead of performing a number of circuit simulations, data mining employs mathematical search algorithm directly into the model, which can save significant analyzed time and improve the efficiency. An optimized mining flow is presented for large scale data set, where the data processing and data mining are performed simultaneously, and thus it is unnecessary to save large extracted data. The proposed data mining method consider both the interconnect structure and the stimulated pattern of a MIMO system, which can perform thoughtful analysis and optimization with high efficiency. Two examples, signal-integrity analysis of two coupled microstrip lines and noise coupling among multiple signal vias through a power-ground plane pair, are presented to demonstrate the efficiency of the proposed data mining method in signal-integrity optimization design.
Keywords :
MIMO systems; S-parameters; circuit optimisation; circuit simulation; data mining; microstrip lines; MIMO networks; MIMO system; black-box S-parameter models; coupled microstrip lines; data mining; interconnect structure; mathematical search algorithm; multiple-input multiple-output networks; noise coupling; power-ground plane pair; signal integrity analysis; signal integrity optimization design; simultaneous switching noise; Couplings; Data mining; Integrated circuit interconnections; Integrated circuit modeling; MIMO; Noise; Scattering parameters; Data mining; S-parameter; signal integrity; simultaneous switching noise (SSN); simultaneous switching noise (SSN).;
fLanguage :
English
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
2156-3950
Type :
jour
DOI :
10.1109/TCPMT.2014.2306957
Filename :
6755486
Link To Document :
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