Title :
Time-domain network analysis of MM-wave circuits based on a photoconductive probe sampling technique
Author :
Kim, Jung-Ho ; Son, J. ; Wakana, S. ; Nees, J. ; Williamson, S. ; Whitaker, J. ; Kwon, Y. ; Pavlidis, D.
Author_Institution :
Michigan Univ., Ann Arbor, MI, USA
Abstract :
A photoconductive probe sampling technique with 2-ps temporal resolution and microvolt sensitivity has been developed. The photoconductive probe sampling technique combines the ultrafast optical technology of the 120-fs Ti-sapphire short pulse laser and the microfabrication technology of the silicon-on-sapphire photoconductive sampling probe, which consists of a high-impedance interdigitated photoconductive switch. This technique can be applied to the measurement of the S-parameters of millimeter-wave circuit components with a 120-GHz measurement bandwidth. The probe technology was applied to the characterization of millimeter-wave band-block filters used in InP-based heterostructure MMICs (monolithic microwave integrated circuits) for 90-GHz to 180-GHz frequency doubling. Millimeter-wave delay lines have also been characterized, and the properties of transmission lines on thin semiconductor substrates have been studied.<>
Keywords :
MMIC; S-parameters; high-speed optical techniques; integrated circuit testing; measurement by laser beam; microwave measurement; photoconducting devices; probes; time-domain analysis; 120 GHz; 120 fs; 180 GHz; 2 ps; 90 GHz; Al/sub 2/O/sub 3/:Ti laser; InP; InP-based heterostructure; MM-wave circuits; MMICs; S-parameters; SOS probe; Si-Al/sub 2/O/sub 3/; Ti-sapphire; band-block filters; components; delay lines; frequency doubling; high-impedance; interdigitated photoconductive switch; microfabrication technology; microvolt sensitivity; millimeter-wave circuit; monolithic microwave integrated circuits; photoconductive probe sampling; short pulse laser; thin semiconductor substrates; transmission lines; ultrafast optical technology; Circuit analysis; Integrated circuit measurements; Millimeter wave integrated circuits; Millimeter wave measurements; Millimeter wave technology; Photoconducting devices; Photoconductivity; Probes; Sampling methods; Time domain analysis;
Conference_Titel :
Microwave Symposium Digest, 1993., IEEE MTT-S International
Conference_Location :
Atlanta, GA, USA
Print_ISBN :
0-7803-1209-0
DOI :
10.1109/MWSYM.1993.277129