Title : 
Conducted EMI characteristic and its implications to filter design in 3-phase diode front-end converters
         
        
            Author : 
Shen, W. ; Wang, F. ; Boroyevich, D.
         
        
            Author_Institution : 
Bradley Dept. of Electr. & Comput. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
         
        
        
        
        
            Abstract : 
EMI filter is becoming an essential part for modern power converter products, contributing to significant cost and sizes. Effective EMI filter design involves the identification and separation of common-mode (CM) and differential-mode (DM) conducted noises of the converter. In this paper, the impact by the diode conduction patterns on the EMI characteristics of a three-phase diode front-end converter is analyzed. There are classical two-line CM and DM noises similar to single phase cases corresponding to the two diode conducting case, the "mixed-mode" CM noise corresponding to no diodes conducting cases, and the three-line CM and DM noise corresponding to commutation cases. Though the present filter design based on single-phase approach seems to be adequate as a worst-case design, a more generic approach considering all three conditions together may provide opportunities for filter design optimization.
         
        
            Keywords : 
electromagnetic interference; interference suppression; optimisation; power convertors; power filters; semiconductor device noise; semiconductor diodes; CM; DM; EMI filter; common-mode conducted noise; commutation; differential-mode conducted noise; diode conduction; filter design optimization; power converter product; three-phase diode front-end converter; Circuit noise; Delta modulation; Electromagnetic interference; Equivalent circuits; Filters; Noise generators; Noise measurement; Phase noise; Semiconductor device noise; Semiconductor diodes;
         
        
        
        
            Conference_Titel : 
Industry Applications Conference, 2004. 39th IAS Annual Meeting. Conference Record of the 2004 IEEE
         
        
        
            Print_ISBN : 
0-7803-8486-5
         
        
        
            DOI : 
10.1109/IAS.2004.1348720