DocumentCode
1682319
Title
Increasing implementability of β-driven threshold checkers
Author
Varshavsky, V. ; Levin, I. ; Ostrovsky, V.
Author_Institution
Neral Networks Technol. Ltd., Bnei-Brak, Israel
fYear
2003
Firstpage
158
Abstract
Implementation of checkers on the basis of threshold functions is problematic due to low stability of component threshold schemes. The paper proposes two methods allowing increasing the implementability: a) by introducing a relatively small overhead for preliminary exclusion of defective circuits; and b) by using a specific procedure of calibration. The first method is proposed upon considering a method of majority reservation while the second is based on a specific learning procedure that is known from studying β-driven threshold elements as a basis for CMOS artificial neurons.
Keywords
CMOS integrated circuits; CMOS logic circuits; circuit testing; fault diagnosis; β-driven threshold checkers implementability; β-driven threshold elements; CMOS artificial neurons; calibration; component threshold scheme stability; defective circuits; majority evaluation; operation conductivity; specific learning procedure; threshold functions; CMOS technology; Calibration; Circuit simulation; Circuit testing; Coupling circuits; Fault tolerant systems; Neurons; Productivity; SPICE; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
On-Line Testing Symposium, 2003. IOLTS 2003. 9th IEEE
Print_ISBN
0-7695-1968-7
Type
conf
DOI
10.1109/OLT.2003.1214384
Filename
1214384
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