• DocumentCode
    1682319
  • Title

    Increasing implementability of β-driven threshold checkers

  • Author

    Varshavsky, V. ; Levin, I. ; Ostrovsky, V.

  • Author_Institution
    Neral Networks Technol. Ltd., Bnei-Brak, Israel
  • fYear
    2003
  • Firstpage
    158
  • Abstract
    Implementation of checkers on the basis of threshold functions is problematic due to low stability of component threshold schemes. The paper proposes two methods allowing increasing the implementability: a) by introducing a relatively small overhead for preliminary exclusion of defective circuits; and b) by using a specific procedure of calibration. The first method is proposed upon considering a method of majority reservation while the second is based on a specific learning procedure that is known from studying β-driven threshold elements as a basis for CMOS artificial neurons.
  • Keywords
    CMOS integrated circuits; CMOS logic circuits; circuit testing; fault diagnosis; β-driven threshold checkers implementability; β-driven threshold elements; CMOS artificial neurons; calibration; component threshold scheme stability; defective circuits; majority evaluation; operation conductivity; specific learning procedure; threshold functions; CMOS technology; Calibration; Circuit simulation; Circuit testing; Coupling circuits; Fault tolerant systems; Neurons; Productivity; SPICE; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium, 2003. IOLTS 2003. 9th IEEE
  • Print_ISBN
    0-7695-1968-7
  • Type

    conf

  • DOI
    10.1109/OLT.2003.1214384
  • Filename
    1214384