Title :
Increasing implementability of β-driven threshold checkers
Author :
Varshavsky, V. ; Levin, I. ; Ostrovsky, V.
Author_Institution :
Neral Networks Technol. Ltd., Bnei-Brak, Israel
Abstract :
Implementation of checkers on the basis of threshold functions is problematic due to low stability of component threshold schemes. The paper proposes two methods allowing increasing the implementability: a) by introducing a relatively small overhead for preliminary exclusion of defective circuits; and b) by using a specific procedure of calibration. The first method is proposed upon considering a method of majority reservation while the second is based on a specific learning procedure that is known from studying β-driven threshold elements as a basis for CMOS artificial neurons.
Keywords :
CMOS integrated circuits; CMOS logic circuits; circuit testing; fault diagnosis; β-driven threshold checkers implementability; β-driven threshold elements; CMOS artificial neurons; calibration; component threshold scheme stability; defective circuits; majority evaluation; operation conductivity; specific learning procedure; threshold functions; CMOS technology; Calibration; Circuit simulation; Circuit testing; Coupling circuits; Fault tolerant systems; Neurons; Productivity; SPICE; Very large scale integration;
Conference_Titel :
On-Line Testing Symposium, 2003. IOLTS 2003. 9th IEEE
Print_ISBN :
0-7695-1968-7
DOI :
10.1109/OLT.2003.1214384
