Title :
Radiation test methodology for SRAM-based FPGAs by using THESIC+
Author :
Alderighi, M. ; Casini, F. ; D´Angelo, S. ; Faure, F. ; Mancini, M. ; Pastore, S. ; Sechi, G.R. ; Velazco, R.
Author_Institution :
Ist. di Astrofisica Spaziale e Fisica Cosmica, Milano, Italy
Abstract :
Benefits resulting from the adoption of SRAM-based FPGAs as design target technology in space applications are manifold. These devices, however, exhibit a potentially high susceptibility to single event upsets (SEU) due to the presence of a large number of configuration memory cells. As fault injection alone is not able to reach every circuitry inside FPGA, radiation ground testing is mandatory in order to perform the analysis on a larger set of SEU upsets. This paper presents a radiation test methodology for Xilinx Virtex FPGAs based on the THESIC+ system.
Keywords :
SRAM chips; fault tolerance; field programmable gate arrays; integrated circuit reliability; integrated circuit testing; logic testing; radiation effects; SRAM-based FPGA; THESIC+ system; Xilinx Virtex FPGAs; configuration memory cells; fault injection; radiation ground testing; radiation test methodology; single event upsets susceptibility; space applications; Circuit faults; Circuit testing; Conferences; Fault tolerance; Field programmable gate arrays; Laboratories; Performance evaluation; Single event upset; Space technology; System testing;
Conference_Titel :
On-Line Testing Symposium, 2003. IOLTS 2003. 9th IEEE
Print_ISBN :
0-7695-1968-7
DOI :
10.1109/OLT.2003.1214388
