Perspectives of combining online and offline test technology for dependable systems on a chip

Author

Galke, Christian ; Grabow, Marcus ; Vierhaus, Heinrich Theodor

Author_Institution

Comput. Eng. Group, Brandenburg Univ. of Technol. Cottbus, Germany

fYear

2003

Firstpage

183

Lastpage

187

Abstract

Silicon IC technology is entering a new stage of development with the arrival of structures below 100 nm. Such devices are volatile to external radiation effects caused by radioactive particles. Hence circuits in safety critical applications must be self-testing and self-correcting. Production test for complex ICs in deep sub-micron technology is also becoming impossible without built-in self test technology. In this paper, we try to analyze in how far self-test technology for production test and for online self test can be combined for reducing the overall overhead for testing.

Keywords

built-in self test; elemental semiconductors; integrated circuit reliability; integrated circuit testing; logic testing; radiation hardening (electronics); silicon; system-on-chip; 100 nm; Si; SoC test architecture; asynchronous system; built-in self test technology; external radiation effect; integrated circuit; offline test technology; online test technology; radioactive particle; self-correcting; self-test technology; silicon IC technology; sub-micron technology; systems on a chip; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Integrated circuit technology; Integrated circuit testing; Logic devices; Logic testing; Production; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

On-Line Testing Symposium, 2003. IOLTS 2003. 9th IEEE

Print_ISBN

0-7695-1968-7

Type

conf

DOI

10.1109/OLT.2003.1214396

Filename

1214396