• DocumentCode
    1682735
  • Title

    A methodology for test replacement solutions of obsolete processors

  • Author

    Velazco, R. ; Anghel, L. ; Saleh, S.

  • Author_Institution
    TIMA Lab., Grenoble, France
  • fYear
    2003
  • Firstpage
    209
  • Lastpage
    213
  • Abstract
    Obsolescence of electronic components is a big concern affecting most electronic equipments involved in safety critical applications (automotive, avionics, airframe, nuclear plants, military applications...). Indeed, such applications are active years longer than was originally anticipated. This paper addresses a methodology to validate emulated replacement solutions and propose solutions to be experienced on a Motorola 6800 processor to illustrate the proposed approach.
  • Keywords
    integrated circuit reliability; integrated circuit testing; microprocessor chips; timing; FPGA; Motorola 6800 processor; electronic component obsolescence; field programmable gate arrays; obsolete processor; target processor; test replacement solution; Application software; Automotive engineering; Costs; Design engineering; Field programmable gate arrays; Hardware; Microelectronics; Microprocessors; Military computing; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium, 2003. IOLTS 2003. 9th IEEE
  • Print_ISBN
    0-7695-1968-7
  • Type

    conf

  • DOI
    10.1109/OLT.2003.1214400
  • Filename
    1214400