Title :
Probabilistic neural network for pattern classification
Author :
Patra, Prashant Kumar ; Nayak, Manojranjan ; Nayak, Simanth Kumar ; Gobbak, Nataraj Kumar
Author_Institution :
Dept. of Comput. Sci. & Application, Coll. of Eng. & Technol., Orissa, India
fDate :
6/24/1905 12:00:00 AM
Abstract :
A neural network (NN) based approach for classification of images which are invariant to translation, scale and rotation is presented. The utilized network is a probabilistic neural network (PNN) classifier. The translation and scale invariant features are obtained by Fourier-modified direct Mellin transform (F-MDMT) method. The rotation invariance is obtained by Zernike moments. The classification accuracy was compared to the Bayes classifier, K-nearest neighborhood, minimum mean distance and MLP classifier. The PNN classifier gave better accuracy when compared with other methods. Similarly, F-MDMT combined with Zernike moment method was found to be better when compared with other methods like geometrical method, etc. The input data was all 49 different characters of Oriya language having each pixel size 64×64. The noise analysis was carried out and was found that the present technique was better so far as input noise is considered. This method can also be suitable for any type of 3D object recognition
Keywords :
Fourier transforms; character recognition; learning (artificial intelligence); method of moments; multilayer perceptrons; pattern classification; Fourier modified direct Mellin transform; Oriya language; Zernike moments; character recognition; multilayer perceptron; pattern classification; probabilistic neural network; scale invariant features; Application software; Computer science; Discrete Fourier transforms; Feature extraction; Filtering; Fourier transforms; Low pass filters; Neural networks; Pattern classification; Polynomials;
Conference_Titel :
Neural Networks, 2002. IJCNN '02. Proceedings of the 2002 International Joint Conference on
Conference_Location :
Honolulu, HI
Print_ISBN :
0-7803-7278-6
DOI :
10.1109/IJCNN.2002.1007665