Title :
Modular mixed signal testing: high speed or high resolution
Author_Institution :
LTX Corp., Westwood, MA, USA
Abstract :
Modular architecture for a DSP based waveform synthesizer/digitizer allows a common formatter to drive either a high speed or a high resolution analog subsystem. Software for either choice is almost identical
Keywords :
automatic testing; digital signal processing chips; integrated circuit testing; mixed analogue-digital integrated circuits; waveform generators; DSP based waveform synthesizer/digitizer; analog subsystem; architecture; common formatter; high resolution; high speed; modular architecture; modular mixed signal testing; software; Automatic testing; Circuit testing; Clocks; Digital signal processing; Instruments; Jitter; Power engineering and energy; Signal resolution; Synthesizers; System testing;
Conference_Titel :
Test Conference, 1994. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2103-0
DOI :
10.1109/TEST.1994.527961
