Title :
Thermal near-field optical spectroscopy
Author :
Jones, Andrew C. ; Raschke, Markus B.
Author_Institution :
Dept. of Phys. & Chem., Univ. of Washington, Seattle, WA, USA
Abstract :
Scattering near-field microscopy with heated tips is used to spectroscopically characterize the spatially and spectrally distinct infrared thermal near-field demonstrating for the first time the resonant enhancement of the underlying electromagnetic local density of states.
Keywords :
infrared spectroscopy; distinct infrared thermal near-field; electromagnetic local density; scattering near-field microscopy; thermal near-field optical spectroscopy; Electromagnetics; Heating; Materials; Microscopy; Optical surface waves; Silicon carbide; Tin;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2012 Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4673-1839-6
