A new approach to effective circuit clustering

It is pointed out that the complexity of next-generation VLSI systems will exceed the capabilities of top-down layout synthesis algorithms, particularly in netlist partitioning and module placement. Bottom-up clustering is needed to condense the netlist so that the problem size becomes tractable to existing optimization methods. Here, the DS quality measure, a general metric for evaluation of clustering algorithms, is established. The DC metric in turn motivates the RW-ST algorithm, a self-tuning clustering method based on random walks in the circuit netlist. RW-ST efficiently captures a globally good circuit clustering. When incorporated within a two-phase iterative Fiduccia-Mattheyses partitioning strategy, the RW-ST clustering method improves bisection width by an average of 17% over previous matching-based methods.<>