Title :
Roadmap for extending IEEE 1149.1 for hierarchical control of locally-stored, standardized command set, test programs
Author_Institution :
Nat. Semicond. Corp., South Portland, ME, USA
Abstract :
This paper proposes a roadmap for an embedded system test strategy that uses IEEE Standard 1149.1 as a multidrop, addressable backplane test bus to provide test access by a central diagnostic processor to local diagnostics contained in flash memory chips located on each module. This proposal is an 1149.1 extension based upon the SCAN Bridge which in turn was based on Bhavsar´s paper (1991) which extended 1149.1 as a backplane test bus. This roadmap also borrows some of the key features of IEEE P1149.5, a proposed standard backplane test bus
Keywords :
IEEE standards; automatic test equipment; electronic equipment testing; peripheral interfaces; production testing; ASIC; IEEE Standard 1149.1; SCAN Bridge; addressable backplane test bus; backplane test bus; central diagnostic processor; embedded system test strategy; flash memory chips; local diagnostics; locally-stored standardized command set; roadmap; slave module interface; test programs; Access protocols; Application specific integrated circuits; Automatic testing; Backplanes; Circuit testing; Flash memory; Production facilities; Read-write memory; Registers; System testing;
Conference_Titel :
Test Conference, 1994. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2103-0
DOI :
10.1109/TEST.1994.527963
