• DocumentCode
    1683981
  • Title

    Performance characterization and optimization of parallel I/O on the Cray XT

  • Author

    Yu, Weikuan ; Vetter, Jeffrey S. ; Oral, H. Sarp

  • Author_Institution
    Oak Ridge Nat. Lab., Oak Ridge, TN
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    11
  • Abstract
    This paper presents an extensive characterization, tuning, and optimization of parallel I/O on the Cray XT supercomputer, named Jaguar, at Oak Ridge National Laboratory. We have characterized the performance and scalability for different levels of storage hierarchy including a single Lustre object storage target, a single S2A storage couplet, and the entire system. Our analysis covers both data- and metadata-intensive I/O patterns. In particular, for small, non-contiguous data- intensive I/O on Jaguar, we have evaluated several parallel I/O techniques, such as data sieving and two- phase collective I/O, and shed light on their effectiveness. Based on our characterization, we have demonstrated that it is possible, and often prudent, to improve the I/O performance of scientific benchmarks and applications by tuning and optimizing I/O. For example, we demonstrate that the I/O performance of the S3D combustion application can be improved at large scale by tuning the I/O system to avoid a bandwidth degradation of 49% with 8192 processes when compared to 4096 processes. We have also shown that the performance of Flash I/O can be improved by 34% by tuning the collective I/O parameters carefully.
  • Keywords
    parallel machines; Cray XT supercomputer; Flash I/O; Jaguar supercomputer; Lustre object storage target; S2A storage couplet; S3D combustion; metadata-intensive I/O patterns; parallel I/O; performance characterization; scientific benchmarks; Bandwidth; Combustion; Data analysis; High performance computing; Laboratories; Large-scale systems; Oceans; Pattern analysis; Scalability; Supercomputers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Parallel and Distributed Processing, 2008. IPDPS 2008. IEEE International Symposium on
  • Conference_Location
    Miami, FL
  • ISSN
    1530-2075
  • Print_ISBN
    978-1-4244-1693-6
  • Electronic_ISBN
    1530-2075
  • Type

    conf

  • DOI
    10.1109/IPDPS.2008.4536277
  • Filename
    4536277