DocumentCode
1684545
Title
Induction charging of granular materials in an electric field
Author
Wu, Y. ; Castle, G.S.P. ; Inculet, I.I.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Western Ontario, London, Ont., Canada
Volume
4
fYear
2004
Firstpage
2366
Abstract
It is well known that particles can be freely levitated in an electric field due to the charge induced on the particles by the external field. The charge depends upon the electric field strength and particle properties. This paper studies some of these factors to investigate the fundamentals of induction charging for granular materials. An experimental apparatus was set up to collect the levitated particles in a filter contained in a Faraday pail and the charge-to-mass (Q/M) ratio was obtained based on the charge and mass measurements for the samples in the filter. Furthermore, the particle size distribution was measured and analyzed by laser diffraction and microscopy and the surface mean diameter (Ds) and volume mean diameter (Dv) were obtained. In these experiments irregular shaped Al2O3 particles and spherical glass beads with a size range of 30 - 400 μm were used and tested at different electric field strengths. By combining the results of Q/M, Ds, and Dv, the charge per particle was calculated and the results compared with theoretical calculated values. It was confirmed that the particle charge is dependent upon the electric field strength and the particle properties of particle size, shape, density, resistivity and adhesive force.
Keywords
adhesives; aluminium compounds; charge measurement; electric charge; electric fields; granular materials; laser beam applications; mass measurement; particle size measurement; Al2O3; Faraday pail; adhesive force; charge measurements; charge-to-mass ratio; electric field strength; filter; granular materials; induction charging; laser diffraction; laser microscopy; levitated particles; mass measurements; particle charge; particle density; particle resistivity; particle shape; particle size distribution measurement; Charge measurement; Current measurement; Diffraction; Filters; Measurement by laser beam; Microscopy; Particle measurements; Q measurement; Size measurement; Volume measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Conference, 2004. 39th IAS Annual Meeting. Conference Record of the 2004 IEEE
ISSN
0197-2618
Print_ISBN
0-7803-8486-5
Type
conf
DOI
10.1109/IAS.2004.1348806
Filename
1348806
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