Title :
Data-Driven Code-Hopping for MC-CDMA Precoding Schemes
Author :
Masouros, C. ; Alsusa, E.
Author_Institution :
Sch. of Electr. & Electron. Eng., Univ. of Manchester, Manchester
Abstract :
A novel code optimization scheme is presented for the downlink of multicarrier code division multiple access (MC-CDMA) systems employing phase shift keying (PSK) modulation. The optimization is based on dynamically re-allocating the available signature waveforms amongst the users on a symbol-by-symbol basis in order to manipulate and utilize interference amongst them. By applying the appropriate allocation criteria destructive interference between users is minimized while constructive is maximized. As a result, employing this on top of conventional schemes enhances the received signal to interference-plus-noise ratio (SINR) without additional transmitted power-per-user investment. The trade-off to the resulting performance improvement is the need for transmission of some extra side information, which by using the proposed processing is kept to a minimum. While performance benefits can be expected for various scenarios, the focus of this paper is on MC-CDMA precoding schemes. Analysis and simulations show a considerable bit error rate (BER) reduction for the case of decorrelating precoding methods.
Keywords :
code division multiple access; decorrelation; error statistics; interference (signal); modulation coding; phase shift keying; precoding; BER reduction; MC-CDMA precoding scheme; PSK; bit error rate; code optimization; constructive interference; data-driven code-hopping; decorrelation; destructive interference; multicarrier code division multiple access system; phase shift keying modulation; signature waveform reallocation; symbol-by-symbol basis; Analytical models; Bit error rate; Downlink; Interference; Investments; Modulation coding; Multicarrier code division multiple access; Phase modulation; Phase shift keying; Signal to noise ratio;
Conference_Titel :
Global Telecommunications Conference, 2008. IEEE GLOBECOM 2008. IEEE
Conference_Location :
New Orleans, LO
Print_ISBN :
978-1-4244-2324-8
DOI :
10.1109/GLOCOM.2008.ECP.778