• DocumentCode
    1684925
  • Title

    FOSS EKV 2.6 parameter extractor

  • Author

    Grabinski, Wladek ; Tomaszewski, Daniel ; Jazaeri, Farzan ; Mangla, Anurag ; Sallese, Jean-Michel ; Chalkiadaki, Maria-Anna ; Bazigos, Antonios ; Bucher, Matthias

  • Author_Institution
    GMC Res., Switzerland
  • fYear
    2015
  • Firstpage
    181
  • Lastpage
    186
  • Abstract
    The design of advanced integrated circuits (IC) in particular for low power analog and radio-frequency (RF) application becomes more complex as the device level modeling confronting challenges in micro- and nano-meter CMOS processes. As present CMOS technologies continue geometry scaling the designers can benefit using dedicated SPICE MOSFET models and apply specific analog design methodologies. The EKV was developed especially to meet altogether the analog/RF design requirements. This paper describes a basic set of the DC parameter extraction steps for the EKV 2.6 model. The free open source software (FOSS) Profile2D tool was used to illustrate accurate EKV 2.6 DC extraction strategy.
  • Keywords
    CMOS analogue integrated circuits; MOSFET; SPICE; integrated circuit design; semiconductor device models; CMOS technologies; DC parameter extraction steps; EKV 2.6 DC extraction strategy; EKV 2.6 model; FOSS EKV 2.6 parameter extractor; advanced integrated circuits; analog design methodologies; analog/RF design requirements; dedicated SPICE MOSFET models; device level modeling; free open source software Profile2D tool; geometry scaling; low power analog and radio-frequency application; micrometer CMOS process; nanometer CMOS process; Adaptation models; Integrated circuit modeling; MOSFET; Mathematical model; Parameter extraction; Semiconductor device modeling; Voltage measurement; DC; EKV 2.6; FOSS; Profile2D; parameter extraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Mixed Design of Integrated Circuits & Systems (MIXDES), 2015 22nd International Conference
  • Conference_Location
    Torun
  • Print_ISBN
    978-8-3635-7806-0
  • Type

    conf

  • DOI
    10.1109/MIXDES.2015.7208507
  • Filename
    7208507