Title :
1992 IEEE/ACM International Conference on Computer-Aided Design. Digest of Technical Papers [Front Cover]
Abstract :
Presents the front cover from the conference proceedings.
Keywords :
circuit CAD; circuit layout CAD; logic CAD; CMOS circuits; DSP applications; analog CAD; asymptotic waveform evaluation; asynchronous circuit synthesis; clocking; clustering; delay testing; design for testability; design management styles; digital signal processors; field programmable gate arrays; floorplan design; hardware verification; hazards; high density module assembly; high-level design; interconnect analysis; level-sensitive latches; logic synthesis; lookup table; multiview design representations; partitioning; placement; routing; sensitization conditions; sequential automatic test pattern generation; signal transition graphs; simulation; technology driven layout; test application time; timing;
Conference_Titel :
Computer-Aided Design, 1992. ICCAD-92. Digest of Technical Papers., 1992 IEEE/ACM International Conference on
Conference_Location :
Santa Clara, CA, USA
Print_ISBN :
0-8186-3010-8
DOI :
10.1109/ICCAD.1992.279409
