DocumentCode :
1686355
Title :
The study of code density histogram testing method to high-speed ADC based on DSP
Author :
Xu, Dijian ; Peng, Jun
Author_Institution :
Sch. of Electron. Inf. Eng., ChongQing Univ. of Sci. & Technol., Chongqing, China
fYear :
2010
Firstpage :
2069
Lastpage :
2074
Abstract :
Code density histogram testing method based on digital signal processor is one of dynamic testing methods of high-speed analog-to digital converters. It can evaluate the performance of high speed ADC accurately and quickly. The theory of Code density histogram testing method is analyzed. A suit of high-speed ADC dynamic testing station based on PC. DSP. and FIFO was built that can be operated easily. Its hardware design and software program were fulfilled and realized dynamic testing using code density histogram testing method to high-speed ADCM80 (S bits). Testing result indicates the dynamic testing station is feasible and operated easily.
Keywords :
analogue-digital conversion; digital signal processing chips; dynamic testing; integrated circuit testing; ADC; DSP; analog-to digital converters; code density histogram testing method; digital signal processor; dynamic testing station; hardware design; software program; code density histogram testing; digital signal processing; high-speed ADC;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Control and Automation (WCICA), 2010 8th World Congress on
Conference_Location :
Jinan
Print_ISBN :
978-1-4244-6712-9
Type :
conf
DOI :
10.1109/WCICA.2010.5554399
Filename :
5554399
Link To Document :
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