Stability criteria of the thermal characterization of discrete components

Thermal characterization techniques require precise powering and accurate data acquisition equipment. The proper powering is complex due to electrical and thermal stability issues and some device properties. A few methods require trials to ensure the proper powering of the devices. New compound semiconductor devices have further stability issues at low currents and high voltages. This paper analyzes setups for powering two-pole and three-pole semiconductor devices with great emphasis on the stability issues. Methods are presented which ensure stability and proper powering on the devices, such as programmed powering technique, which eliminates oscillations as well.