Title :
FMEA automation for the complete design process
Author :
Montgomery, Thomas A. ; Pugh, David ; Leedham, Steve T. ; Twitchett, S.R.
Author_Institution :
Ford Motor Co., Dearborn, MI, USA
Abstract :
Performing an FMEA during the design stage is a valuable technique for improving the reliability of a product. Unfortunately, the traditional brainstorming approach is also very tedious, time consuming, and error prone. Automating the process promises the generation of a more complete, consistent FMEA worksheet in a fraction of the time currently required. However, to be truly valuable, this automation must follow the product though the entire design cycle at each level of design: architecture; subsystem; and component. This paper presents an FMEA automation approach that spans the entire design cycle for electrical/electronic circuits. Brainstorming is replaced by computer simulation of failure modes and their effects. Qualitative simulation is used in the early (architectural) stages when design detail is not available. As the design progresses, the qualitative simulation gives way to quantitative simulation. Throughout, the information required to perform the FMEA is gleaned from that used to understand the nominal behavior of the circuit; thus the relief from brainstorming is not offset by a new modeling burden. Sample results from software supporting this approach are presented
Keywords :
engineering computing; failure analysis; product development; reliability; FMEA automation; FMEA worksheet; architecture; brainstorming approach; complete design process; component; computer simulation; design cycle; failure modes; product reliability; qualitative simulation; quantitative simulation; software; subsystem; Analytical models; Brain modeling; Circuit simulation; Computational modeling; Computer architecture; Computer simulation; Design automation; Electronic circuits; Failure analysis; Process design;
Conference_Titel :
Reliability and Maintainability Symposium, 1996 Proceedings. International Symposium on Product Quality and Integrity., Annual
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-7803-3112-5
DOI :
10.1109/RAMS.1996.500638