Analog testing stimulus optimization for generating by means of Sigma-Delta modulation

This paper proposes the evolutionary technique of the stimulus signal optimization for the analog electronic circuit testing purpose. The obtained signal is coded with Sigma-Delta modulation usage that allows to generate it easily by simple microcontrollers without the necessity of expensive D/A peripherals applying. The signal with the controlled impulses density may be obtained on the external output terminal of the typical timer and finally, it defines the analog signal that can be reconstructed after low pass filtering.