DocumentCode
1686862
Title
Design and measurement methodology for a sub-picoampere current digitiser
Author
Voulgari, Evgenia ; Noy, Matthew ; Anghinolfi, Francis ; Krummenacher, Francois ; Kayal, Maher
Author_Institution
CERN, Geneva, Switzerland
fYear
2015
Firstpage
525
Lastpage
529
Abstract
This paper introduces some design and measurement techniques that were used in the design and the testing of an ASIC for ultra-low current sensing. The idea behind this paper is to present the limitations in sub-picoampere current measurements and demonstrate an ASIC that can accurately measure the different sources of leakage currents and the methodology of measuring. Then the leakage current can be subtracted or compensated in order to accurately measure the ultra-low current that is generated from a sensor/detector. The proposed ASIC can measure currents as low as -50 fA, a value well below similar ASIC implementations.
Keywords
analogue-digital conversion; application specific integrated circuits; integrated circuit design; integrated circuit measurement; leakage currents; ASIC; leakage currents; low current sensing; measurement techniques; subpicoampere current digitiser; Application specific integrated circuits; Current measurement; Detectors; Electrostatic discharges; Leakage currents; Subthreshold current; Temperature measurement; Ultra-low current sensing; leakage current; radiation detection; sub-picoampere current measurements;
fLanguage
English
Publisher
ieee
Conference_Titel
Mixed Design of Integrated Circuits & Systems (MIXDES), 2015 22nd International Conference
Conference_Location
Torun
Print_ISBN
978-8-3635-7806-0
Type
conf
DOI
10.1109/MIXDES.2015.7208578
Filename
7208578
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