Two-Dimensional MTF and Crosstalk Characterization for CMOS Image Sensors

Author

Segal, Razy ; Shcherback, Igor ; Yadid-Pecht, Orly

Author_Institution

VLSI Systems Center, Ben-Gurion University, P.O.B. 653 Beer-Sheva, 84105, ISRAEL.

fYear

2006

Firstpage

349

Lastpage

353

Abstract

This work describes a new approach to CMOS Image Sensors (CIS) characterization, based on the Submicron Scanning System (S-cube system). The S-cube system inherently enables two-dimensional responsivity map acquisition for CISs and provides a 2-D pixel Point Spread Function (PSF), 2-D pixel Modulation Transfer Function (MTF) and 2-D sensor crosstalk (CTK) measurements. The effectiveness and advantages of the proposed method are shown; enabling to determine both, the influence of each pixel-composing element on its overall signal, and sensor resolution abilities characterization for each wavelength of interest. The advantages and necessity of 2-D characterization for sensor performance understanding and improvement are clearly emphasized.

Keywords

CMOS image sensors; Computational Intelligence Society; Crosstalk; Pixel; Sensor arrays; Sensor phenomena and characterization; Signal resolution; Transfer functions; Two dimensional displays; Very large scale integration; Active Pixel Sensor (APS); CMOS image sensor (CIS); Modulation Transfer Function (MTF); Point Spread Function (PSF); crosstalk (CTK);

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical and Electronics Engineers in Israel, 2006 IEEE 24th Convention of

Conference_Location

Eilat, Israel

Print_ISBN

1-4244-0229-8

Electronic_ISBN

1-4244-0230-1

Type

conf

DOI

10.1109/EEEI.2006.321101

Filename

4115309