Title :
Planning and optimizing environmental stress screening
Author :
Mok, Y.L. ; Xie, M.
Author_Institution :
Defence Sci. Organ., Singapore
Abstract :
Environmental stress screening (ESS) is widely used in the electronics industries as a means to remove early failures. It is a process that calls for proper planning as inadequate duration is ineffective while prolonged screening can incur unnecessary cost. This note describes an approach utilizing mathematical programming to ensure that the right amount of screening is in place at each assembly level. The factors considered include the screening cost and desired operational reliability
Keywords :
electronic equipment testing; environmental stress screening; failure analysis; mathematical programming; General Algebraic Modelling System; assembly; early failures removal; electronics industries; environmental stress screening optimisation; environmental stress screening planning; mathematical programming; operational reliability; screening cost; Assembly; Cost function; Electronic switching systems; Electronics industry; Hardware; Mathematical programming; Stress; Temperature dependence; Temperature distribution; Temperature sensors;
Conference_Titel :
Reliability and Maintainability Symposium, 1996 Proceedings. International Symposium on Product Quality and Integrity., Annual
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-7803-3112-5
DOI :
10.1109/RAMS.1996.500662
