• DocumentCode
    1687566
  • Title

    Continuous state reliability analysis

  • Author

    Yang, Kai ; Xue, Jianan

  • Author_Institution
    Dept. of Ind. & Manuf. Eng., Wayne State Univ., Detroit, MI, USA
  • fYear
    1996
  • Firstpage
    251
  • Lastpage
    257
  • Abstract
    In this paper, the authors extend binary state reliability analysis to continuous state reliability analysis. This extension enables the analysis of both catastrophic failure and performance degradation simultaneously. The modeling of degradation is based on an independent increment random process or a normal random process. Regression analysis is used to estimate degradation parameters. The state tree method is introduced to conduct system reliability analysis for both degradation and catastrophic failures. ANOVA and DOE techniques are used to assess the criticality of product parameters or components to performance degradation
  • Keywords
    fault trees; reliability theory; statistical analysis; ANOVA technique; DOE technique; binary state reliability analysis; catastrophic failure; continuous state reliability analysis; degradation modelling; independent increment random process; normal random process; performance degradation; regression analysis; state tree method; Analysis of variance; Degradation; Failure analysis; Independent component analysis; Parameter estimation; Performance analysis; Random processes; Regression analysis; Reliability; US Department of Energy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 1996 Proceedings. International Symposium on Product Quality and Integrity., Annual
  • Conference_Location
    Las Vegas, NV
  • ISSN
    0149-144X
  • Print_ISBN
    0-7803-3112-5
  • Type

    conf

  • DOI
    10.1109/RAMS.1996.500670
  • Filename
    500670