Title :
Fabrication of ultra-compact photonic structures in silicon-on-insulator (SOI) using 248 nm deep UV lithography
Author :
Bogaerts, Wim ; Wiaux, Vincent ; Taillaert, Dirk ; Beckx, Stephan ; Baets, Roel
Author_Institution :
Dept. of Inf. Technol., Univ. Gent, Belgium
fDate :
6/24/1905 12:00:00 AM
Abstract :
We demonstrate the use of deep UV lithography for the fabrication of wavelength-scale photonic structures. Mass-fabricating ultra-compact structures like photonic crystals is not a straightforward process. Serial writing techniques like e-beam lithography are too slow, while standard optical lithography lacks the required resolution. Deep UV lithography, as used today in the CMOS industry, promises to deliver the accuracy together with the high volume capacity. In this paper, we will show photonic crystal-based structures fabricated with deep UV lithography. We will discuss the fabrication process, and how the differences of these structures with typical CMOS structures make the application of this technology anything but straightforward.
Keywords :
X-ray lithography; micro-optics; optical fabrication; photonic crystals; silicon; silicon-on-insulator; ultraviolet lithography; 248 nm; CMOS industry; accuracy; deep UV lithography; fabrication process; high volume capacity; mass-fabrication; photonic crystal-based structures; silicon-on-insulator; ultra-compact photonic structures fabrication; ultra-compact structures; wavelength-scale photonic structures; Lithography; Optical device fabrication; Optical refraction; Optical variables control; Optical waveguides; Photonic crystals; Refractive index; Semiconductor waveguides; Silicon on insulator technology; Slabs;
Conference_Titel :
Transparent Optical Networks, 2002. Proceedings of the 2002 4th International Conference on
Print_ISBN :
0-7803-7375-8
DOI :
10.1109/ICTON.2002.1007842