Title :
Approximate Bisimulation for Metric Doubly Labeled Transition System
Author :
Pan, Haiyu ; Zhang, Min ; Chen, Yixiang ; Wu, Hengyang
Author_Institution :
Shanghai Key Lab. of Trustworthy Comput., East China Normal Univ., Shanghai, China
Abstract :
Many researchers suggested extending bisimilarity to quantitative versions to avoid the rigidity of classical bisimilarity. To explore the relation between different notions of approximate bisimilarity mentioned in literature, in this paper, we present a quantitative extension of doubly labeled transition systems, MDLTS, where its states and actions form metric spaces. We then introduce two notions of approximate bisimilarity, (η, λ)-bisimilarity and (η, λ, α)-bisimilarity, and discuss their basic property. We also consider the special kind of (η, λ)-bisimilarity, λ-bisimilarity to characterize the branching distance with arbitrary discount α of metric labeled transition system. Finally, we discuss the translation between metric transition system and MDLTS which preserves the approximate bisimilarity.
Keywords :
bisimulation equivalence; finite automata; approximate bisimilarity; approximate bisimulation; branching distance; metric doubly labeled transition system; Conferences; Educational institutions; Estimation error; Extraterrestrial measurements; Laboratories; Timing; Kripke structure; approximate bisimulation; labeled transition system; metric doubly transition system;
Conference_Titel :
Theoretical Aspects of Software Engineering (TASE), 2011 Fifth International Symposium on
Conference_Location :
Xi´an, Shaanxi
Print_ISBN :
978-1-4577-1487-0
DOI :
10.1109/TASE.2011.22