Title :
Power supply noise simulation considering dynamic effect of on-chip current
Author :
Zhou, Yaping ; Dhong, Sang H. ; Nishino, Yoichi ; Harvey, Paul M. ; Mandrekar, Rohan ; Gervais, Gilles ; Criscolo, Nikki
Author_Institution :
IBM Corp., Austin, TX
Abstract :
This paper describes a technique to analyze the dependence of on-chip switching current on power supply voltage and temperature, and how to implement that in power supply noise simulations. It is shown that this on-chip dynamic effect can introduce significant damping to the otherwise passive chip/package/board power supply network
Keywords :
circuit noise; circuit simulation; power supply circuits; board power supply network; on-chip dynamic effect; on-chip switching current; passive chip; power supply noise simulation; Clocks; Current measurement; Leakage current; Logic; Packaging; Power measurement; Power supplies; Power system modeling; Temperature dependence; Voltage;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2006 IEEE
Conference_Location :
Scottsdale, AZ
Print_ISBN :
1-4244-0668-4
DOI :
10.1109/EPEP.2006.321198
