DocumentCode :
1688401
Title :
CPU Power Delivery Impedance Profile Resonances Impact on Core FMAX
Author :
Waizman, Alex ; Vikinski, Omer ; Sizikov, Gregory
Author_Institution :
Intel Israel, Haifa
fYear :
2006
Firstpage :
119
Lastpage :
122
Abstract :
CPU core FMAX dependence on power delivery impedance profile resonances is investigated. Repetitive on/off stimulus degrades FMAX more than a step di/dt stimulus. Multiple resonances may have an additive effect on power supply voltage drops
Keywords :
circuit resonance; computer power supplies; CPU core FMAX dependence; CPU power delivery impedance profile resonances; power supply voltage drops; Capacitors; Costs; Degradation; Impedance measurement; Packaging; Power supplies; Resonance; Resonant frequency; Virtual reality; Voltage; FMAX PENALTY; IMPEDANCE PROFILE RESONANCE; POWER DELIVERY;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Performance of Electronic Packaging, 2006 IEEE
Conference_Location :
Scottsdale, AZ
Print_ISBN :
1-4244-0668-4
Type :
conf
DOI :
10.1109/EPEP.2006.321206
Filename :
4115366
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1688401
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