Title :
Broad-Band Characterization of Conductors with Arbitrary Topology Using a Surface Integral Formulation
Author :
Chiariello, A.G. ; Maffucci, A. ; Miano, G. ; Villone, F. ; Zamboni, W.
Author_Institution :
Universita Federico II di Napoli
Abstract :
In this paper a surface integral formulation is used for the terminal characterization in huge frequency ranges of conducting bodies, with an automatic treatment of complex topologies
Keywords :
conductors (electric); integral equations; broadband characterization; complex topology; conductors; surface integral formulation; Circuit topology; Conductors; Current density; Electrodes; Electronics packaging; Frequency; High-speed electronics; Integrated circuit interconnections; Surface impedance; Surface treatment;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2006 IEEE
Conference_Location :
Scottsdale, AZ
Print_ISBN :
1-4244-0668-4
DOI :
10.1109/EPEP.2006.321209
