Title :
Multiple Edge Responses for Fast and Accurate System Simulations
Author_Institution :
Rambus Inc., Los Altos, CA
Abstract :
Fast and accurate simulation of the system response is important in high-speed I/O system design because performance is severely limited by channel ISI and random noise. This paper presents a novel way to simulate the signal response given an arbitrary bit pattern using multiple edge responses (MER). The presented method provides an accuracy improvement over the traditional approaches which either uses the superposition of single bit response (SBR) or double edge response (DER), while maintaining the equivalent numerical efficiency
Keywords :
error statistics; high-speed integrated circuits; intersymbol interference; random noise; accurate system simulations; arbitrary bit pattern; channel ISI; double edge response; fast system simulations; high-speed I/O system design; multiple edge response; random noise; signal response; single bit response; Bit error rate; Circuit noise; Circuit simulation; Communication system signaling; Computational modeling; Density estimation robust algorithm; Electronics packaging; Impedance; Intersymbol interference; Probability distribution;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2006 IEEE
Conference_Location :
Scottsdale, AZ
Print_ISBN :
1-4244-0668-4
DOI :
10.1109/EPEP.2006.321218