• DocumentCode
    1689433
  • Title

    Improved maximum likelihood frequency estimation based on likelihood metric design

  • Author

    Minn, Hlaing ; Tarasak, Poramate

  • Author_Institution
    Dept. of Electr. Eng., Texas Univ., Richardson, TX, USA
  • Volume
    4
  • fYear
    2005
  • Firstpage
    2150
  • Abstract
    For emerging high data-rate communication systems in highly dispersive channels such as ultra-wideband systems, possible frequency offsets could be larger than the estimation range of the existing methods using training signals with several identical parts. This paper presents a novel improved maximum likelihood frequency offset estimator which can handle at least twice the estimation range of the existing methods using training signals with identical parts and achieves a better estimation performance. Based on the likelihood metric, a new design metric is introduced which is a pair-wise error probability (PEP) between the correct frequency offset point and a trial frequency offset point. The proposed PEP metric gives more theoretical insights on the performance of practical maximum likelihood estimators. How to design the PEP to achieve both a larger estimation range and a better estimation performance in fading channel environments is also presented and the corresponding estimator implementation is described.
  • Keywords
    channel estimation; error statistics; fading channels; frequency estimation; maximum likelihood estimation; ultra wideband communication; data-rate communication system; dispersive channel; fading channel; likelihood metric design; maximum likelihood frequency estimation; pair-wise error probability; training signal; ultrawideband system; Communication systems; Dispersion; Fading; Frequency estimation; Frequency synchronization; Maximum likelihood estimation; Pairwise error probability; Signal design; Time domain analysis; Ultra wideband technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications, 2005. ICC 2005. 2005 IEEE International Conference on
  • Print_ISBN
    0-7803-8938-7
  • Type

    conf

  • DOI
    10.1109/ICC.2005.1494718
  • Filename
    1494718