Title :
Test strategies for a family of complex MCMs
Author_Institution :
Logic & Analog Technol. Group, Motorola Inc., Tempe, AZ, USA
Abstract :
The development of MCM test practices from chip and board test practices is summarized. The general philosophy behind MCM test strategy selection is given. A family of complex MCMs providing computer system building blocks is described. The design features related to testability and test coverage are detailed. Then, test strategies developed for each MCM are related, with emphasis on the improvements in fault coverage and diagnostic resolution provided by attention to design-for-testability
Keywords :
computer testing; fault location; integrated circuit testing; integrated memory circuits; multichip modules; printed circuit testing; board test; chip test; complex MCM; computer interface; design; design-for-testability; diagnostic resolution; fault coverage; nonvolatile memory; test coverage; testability; volatile memory; Automatic logic units; Automatic test pattern generation; Circuit faults; Circuit testing; Design for testability; Fault diagnosis; Integrated circuit testing; Logic testing; Packaging; Production;
Conference_Titel :
Test Conference, 1994. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2103-0
DOI :
10.1109/TEST.1994.527985
