Title :
Full Characterization of Substrate Integrated Waveguides from S-Parameter Measurements
Author :
Torres-Torres, Reydezel ; Romo, Gerardo ; Horine, Bryce ; Sanchez, Abel ; Heck, Howard
Author_Institution :
Intel Mexico Res. Center, Jalisco
Abstract :
A complete methodology to characterize substrate integrated waveguide (SIW) structures from S-parameter measurements is presented. We determined the complex propagation constant, the characteristic impedance of a homogeneous section of waveguide, and the efficiency of different adapters used to launch the signals into the waveguide. After a detailed analysis, it is observed that the most significant losses in an SIW are associated with the adapters since a low insertion loss is presented in a homogeneous section of waveguide
Keywords :
S-parameters; microwave measurement; printed circuits; rectangular waveguides; S-parameter measurements; characteristic impedance; complex propagation constant; insertion loss; substrate integrated waveguides; Dielectric substrates; Electric variables measurement; Electronics packaging; Laboratories; Microstrip antennas; Propagation constant; Rectangular waveguides; Scattering parameters; Transmission line matrix methods; USA Councils;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2006 IEEE
Conference_Location :
Scottsdale, AZ
Print_ISBN :
1-4244-0668-4
DOI :
10.1109/EPEP.2006.321154
