Title :
A method for multiple diffracted ray sampling in forward ray tracing
Author :
Di Giampaolo, E. ; Bardati, F.
Author_Institution :
Dipt. di Ingegneria Elettrica, L´Aquila Univ., Italy
Abstract :
An analytical method for determining the diffraction points in ray tracing is proposed. The general case of diffraction by oblique straight wedges in 3D is considered. The sampling problem is solved for a first order diffracted ray congruence in such a way to provide a suitable sampling of the rays diffracted by a second wedge. The method can be extended to the sampling of higher-order diffracted rays. An example is provided for a couple of orthogonal edges lighted by a point source.
Keywords :
electromagnetic wave diffraction; ray tracing; signal sampling; electromagnetic field prediction; first order diffracted ray; forward ray tracing; higher-order diffracted rays sampling; multiple diffracted ray sampling; oblique straight wedges; orthogonal edges; point source; Electromagnetic coupling; Electromagnetic diffraction; Electromagnetic fields; Electromagnetic reflection; Optical coupling; Optical reflection; Ray tracing; Sampling methods; Testing; Wireless communication;
Conference_Titel :
Antennas and Propagation Society International Symposium, 2001. IEEE
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-7070-8
DOI :
10.1109/APS.2001.958893
