DocumentCode
1689769
Title
A method for multiple diffracted ray sampling in forward ray tracing
Author
Di Giampaolo, E. ; Bardati, F.
Author_Institution
Dipt. di Ingegneria Elettrica, L´Aquila Univ., Italy
Volume
1
fYear
2001
Firstpage
468
Abstract
An analytical method for determining the diffraction points in ray tracing is proposed. The general case of diffraction by oblique straight wedges in 3D is considered. The sampling problem is solved for a first order diffracted ray congruence in such a way to provide a suitable sampling of the rays diffracted by a second wedge. The method can be extended to the sampling of higher-order diffracted rays. An example is provided for a couple of orthogonal edges lighted by a point source.
Keywords
electromagnetic wave diffraction; ray tracing; signal sampling; electromagnetic field prediction; first order diffracted ray; forward ray tracing; higher-order diffracted rays sampling; multiple diffracted ray sampling; oblique straight wedges; orthogonal edges; point source; Electromagnetic coupling; Electromagnetic diffraction; Electromagnetic fields; Electromagnetic reflection; Optical coupling; Optical reflection; Ray tracing; Sampling methods; Testing; Wireless communication;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 2001. IEEE
Conference_Location
Boston, MA, USA
Print_ISBN
0-7803-7070-8
Type
conf
DOI
10.1109/APS.2001.958893
Filename
958893
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