DocumentCode
1690033
Title
An intelligent automatic test and diagnostic system
Author
Peng, Jia-Min ; Men, Jiang-Yong ; Miao, Dong
fYear
1992
Firstpage
588
Abstract
In recognition of the ever increasing problems that manual test approaches bring, an intelligent automatic test and diagnostic system (IATDS) is being developed which is described in the paper. The system performs a functional test to electronic equipment systems under test and provides the operator with a fault diagnostic approach which combines expert system (ES) techniques and guided-probe fault detection and isolation techniques. The major objectives of the system is to decrease test time, to improve diagnostic capabilities and supply guidance to maintenance personnel
Keywords
Artificial intelligence; Automatic testing; Circuit faults; Electronic equipment; Electronic equipment testing; Fault detection; Hardware; Microcomputers; Performance evaluation; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics, 1992., Proceedings of the IEEE International Symposium on
Conference_Location
Xian
Print_ISBN
0-7803-0042-4
Type
conf
DOI
10.1109/ISIE.1992.279669
Filename
279669
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