DocumentCode :
1690033
Title :
An intelligent automatic test and diagnostic system
Author :
Peng, Jia-Min ; Men, Jiang-Yong ; Miao, Dong
fYear :
1992
Firstpage :
588
Abstract :
In recognition of the ever increasing problems that manual test approaches bring, an intelligent automatic test and diagnostic system (IATDS) is being developed which is described in the paper. The system performs a functional test to electronic equipment systems under test and provides the operator with a fault diagnostic approach which combines expert system (ES) techniques and guided-probe fault detection and isolation techniques. The major objectives of the system is to decrease test time, to improve diagnostic capabilities and supply guidance to maintenance personnel
Keywords :
Artificial intelligence; Automatic testing; Circuit faults; Electronic equipment; Electronic equipment testing; Fault detection; Hardware; Microcomputers; Performance evaluation; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics, 1992., Proceedings of the IEEE International Symposium on
Conference_Location :
Xian
Print_ISBN :
0-7803-0042-4
Type :
conf
DOI :
10.1109/ISIE.1992.279669
Filename :
279669
Link To Document :
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