• DocumentCode
    1690033
  • Title

    An intelligent automatic test and diagnostic system

  • Author

    Peng, Jia-Min ; Men, Jiang-Yong ; Miao, Dong

  • fYear
    1992
  • Firstpage
    588
  • Abstract
    In recognition of the ever increasing problems that manual test approaches bring, an intelligent automatic test and diagnostic system (IATDS) is being developed which is described in the paper. The system performs a functional test to electronic equipment systems under test and provides the operator with a fault diagnostic approach which combines expert system (ES) techniques and guided-probe fault detection and isolation techniques. The major objectives of the system is to decrease test time, to improve diagnostic capabilities and supply guidance to maintenance personnel
  • Keywords
    Artificial intelligence; Automatic testing; Circuit faults; Electronic equipment; Electronic equipment testing; Fault detection; Hardware; Microcomputers; Performance evaluation; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 1992., Proceedings of the IEEE International Symposium on
  • Conference_Location
    Xian
  • Print_ISBN
    0-7803-0042-4
  • Type

    conf

  • DOI
    10.1109/ISIE.1992.279669
  • Filename
    279669