Title :
The Temporal Development Of Electrical Breakdown In Laser Triggered GaAs-switches
Author :
Schoenbach, K.H. ; Peterkin, F.E. ; Block, R.
Author_Institution :
Old Dominion University
Keywords :
Breakdown voltage; Diode lasers; Electric breakdown; Electron devices; Electron traps; Gallium arsenide; Laser theory; Optical fiber testing; Optical modulation; Switches;
Conference_Titel :
Plasma Science, 1994. Conference Record - Abstracts., 1994 IEEE International Conference on
Conference_Location :
Santa Fe, NM, USA
Print_ISBN :
0-7803-2006-9
DOI :
10.1109/PLASMA.1994.589056
