Title :
Emerging standards for manufacturing test of system-on-chip design
Author :
Downey, David ; Lysaght, Patrick
Author_Institution :
University of Strathclyde
fDate :
6/21/1905 12:00:00 AM
Conference_Titel :
Systems on a Chip (Ref. No. 1999/133), IEE Colloquium on
Conference_Location :
IET
