DocumentCode :
1690750
Title :
High-Order Analysis of Outage Probability in OFDMA Wireless Networks
Author :
Bai, Bo ; Chen, Wei ; Cao, Zhigang ; Letaief, Khaled B.
Author_Institution :
Dept. of Electron. Eng., Tsinghua Univ., Beijing, China
fYear :
2009
Firstpage :
1
Lastpage :
6
Abstract :
OFDMA is a potential technology that can flexibly allocate subcarriers while providing diversity gain to multiple users. In our recent work, we showed a surprising result that the maximum frequency diversity gain in OFDMA systems is equal to the number of independent subcarriers, i.e., the same as that in point-to-point OFDM systems despite of the fact that multiple users will share a common set of subcarriers. However, the diversity gain only characterizes the first-order outage performance in the high SNR regime, and the outage performance in the low SNR regime, which is very important in practice, is still an open problem. In this paper, we first formulate the subcarrier allocation problem in OFDMA systems as a random bipartite graph model. Then, a more precise outage probability is derived in the high SNR regime using a high-order analysis of the maximum matching on a random bipartite graph. An approximate outage probability in the low SNR regime is also obtained by studying the complement of a random bipartite graph. It is then demonstrated that the coefficient of the second-order term in the outage probability expression is zero except for the scenario of two users with two or three subcarriers.
Keywords :
OFDM modulation; frequency division multiple access; graph theory; probability; radio networks; OFDMA wireless network; high SNR regime; high-order analysis; low SNR regime; outage probability; random bipartite graph model; subcarrier allocation; Bipartite graph; Diversity methods; Fading; Frequency diversity; Information analysis; Laboratories; Microwave technology; OFDM; Radio spectrum management; Wireless networks;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Global Telecommunications Conference, 2009. GLOBECOM 2009. IEEE
Conference_Location :
Honolulu, HI
ISSN :
1930-529X
Print_ISBN :
978-1-4244-4148-8
Type :
conf
DOI :
10.1109/GLOCOM.2009.5425749
Filename :
5425749
Link To Document :
بازگشت