DocumentCode :
1690773
Title :
GLFSR-a new test pattern generator for built-in-self-test
Author :
Pradhan, Dhiraj K. ; Chatterjee, Mitrajit
Author_Institution :
Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
fYear :
34608
Firstpage :
481
Lastpage :
490
Abstract :
A new and effective pseudo-random test pattern generator, termed GLFSR, is introduced. These are linear feedback shift registers over a Galois field GF(2δ), (δ>1). Unlike conventional LFSRs, which are over GF(2), these generators are not equivalent to cellular arrays, and are shown do achieve significantly higher fault coverage. Experimental results are presented in this paper depicting that the proposed GLFSR can attain fault coverage equivalent to the LFSR, but with significantly fewer patterns. Specifically, results obtained demonstrate that in combinational circuits, for both stuck-at as well as transition faults, the proposed GLFSR outperforms all conventional pattern generators. Moreover, these experimental results are validated by certain randomness tests which demonstrate that the patterns generated by GLFSR achieve a higher degree of randomness
Keywords :
automatic testing; built-in self test; combinational circuits; integrated circuit testing; integrated logic circuits; logic testing; sequential circuits; GLFSR; Galois field; VLSI; built-in-self-test; combinational circuits; delay faults; fault coverage; linear feedback shift registers; pseudo-random test pattern generator; randomness; sequential circuits; signature analyser; stuck-at faults; transition faults; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Galois fields; Linear feedback shift registers; Shift registers; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1994. Proceedings., International
Conference_Location :
Washington, DC
ISSN :
1089-3539
Print_ISBN :
0-7803-2103-0
Type :
conf
DOI :
10.1109/TEST.1994.527990
Filename :
527990
Link To Document :
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