DocumentCode :
1691187
Title :
A novel substrate-assisted RESURF technology for small curvature radius junction
Author :
Qiao, Ming ; Hu, Xi ; Wen, Hengjuan ; Wang, Meng ; Luo, Bo ; Luo, Xiaorong ; Wang, Zhuo ; Zhang, Bo ; Li, Zhaoji
Author_Institution :
State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China
fYear :
2011
Firstpage :
16
Lastpage :
19
Abstract :
A novel substrate-assisted (SA) RESURF technology aiming at improving off-state breakdown voltage (BV) of PN junction with small curvature radius is proposed and experimentally demonstrated in this paper. The SA RESURF technology not only realizes small curvature radius in the fingertip region, but also reduces electric field concentration in the curved metallurgical junction. Low-doped P-substrate, which increases depletion of the small curvature radius junction and reduces electric field concentration in the curved metallurgical junction, is adopted in the source fingertip region. Owing to the existence of low-doped P-substrate, the abrupt PN junction with small curvature radius is adjusted to low-doped PN junction with large curvature radius. The SA RESURF technology can be widely applied to lateral high voltage devices with small curved junction, especially to lateral super junction devices. A CBSLOP-LDMOS with the proposed SA RESURF technology has been developed. The experimental results show that the CBSLOP-LDMOS exhibits off-state BV of 700 V and specific on-resistance (Ron, sp) of 142 mΩ·cm2.
Keywords :
metallurgy; power semiconductor devices; substrates; curved metallurgical junction; electric field concentration; off-state breakdown voltage; reduced surface field technology; small curvature radius junction; substrate-assisted RESURF technology; voltage 700 V; Breakdown voltage; Electric breakdown; Electric fields; Junctions; Substrates; Surface resistance; USA Councils;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices and ICs (ISPSD), 2011 IEEE 23rd International Symposium on
Conference_Location :
San Diego, CA
ISSN :
1943-653X
Print_ISBN :
978-1-4244-8425-6
Type :
conf
DOI :
10.1109/ISPSD.2011.5890779
Filename :
5890779
Link To Document :
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