DocumentCode
1691218
Title
Hierarchical classification system for diagnosis of semiconductor transistor
Author
Redford, M.A.
Author_Institution
System Professional Eng. Inc., Lansing, MI
fYear
1992
Firstpage
827
Abstract
Discusses the development of a diagnostic system that will address the critical troubleshooting problems. In the classification hierarchy full consideration must be given to knowledge abstraction, the set of solutions to which the interference structure has to map data, heuristic associations, and the problem solving architecture. Smalltalk was used as the classification reasoning tool, to illustrate artificial intelligence techniques
Keywords
Smalltalk; artificial intelligence; automatic test equipment; electronic engineering computing; semiconductor device testing; transistors; Smalltalk; artificial intelligence; classification reasoning tool; diagnostic system; heuristic associations; hierarchical classification; interference structure; knowledge abstraction; problem solving architecture; semiconductor transistor; troubleshooting problems; Bipolar transistors; Classification tree analysis; Costs; Equations; Equivalent circuits; Frequency; Operational amplifiers; Strontium; Systems engineering and theory; Tree data structures;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics, 1992., Proceedings of the IEEE International Symposium on
Conference_Location
Xian
Print_ISBN
0-7803-0042-4
Type
conf
DOI
10.1109/ISIE.1992.279714
Filename
279714
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