Title :
Hierarchical classification system for diagnosis of semiconductor transistor
Author_Institution :
System Professional Eng. Inc., Lansing, MI
Abstract :
Discusses the development of a diagnostic system that will address the critical troubleshooting problems. In the classification hierarchy full consideration must be given to knowledge abstraction, the set of solutions to which the interference structure has to map data, heuristic associations, and the problem solving architecture. Smalltalk was used as the classification reasoning tool, to illustrate artificial intelligence techniques
Keywords :
Smalltalk; artificial intelligence; automatic test equipment; electronic engineering computing; semiconductor device testing; transistors; Smalltalk; artificial intelligence; classification reasoning tool; diagnostic system; heuristic associations; hierarchical classification; interference structure; knowledge abstraction; problem solving architecture; semiconductor transistor; troubleshooting problems; Bipolar transistors; Classification tree analysis; Costs; Equations; Equivalent circuits; Frequency; Operational amplifiers; Strontium; Systems engineering and theory; Tree data structures;
Conference_Titel :
Industrial Electronics, 1992., Proceedings of the IEEE International Symposium on
Conference_Location :
Xian
Print_ISBN :
0-7803-0042-4
DOI :
10.1109/ISIE.1992.279714
