Title :
Using remote update controller of FPGA´s as built-in self test for embedded systems
Author_Institution :
Astro Strobel, Bergisch Gladbach, Germany
Abstract :
This paper is an approach of a reliable built-in self test (BIST) on FPGA based embedded systems (e.g. digital TV receivers, compact head-ends, etc.), which could easily be executed by consumers. The proposed technology is quite similar to boundary scan testing via JTAG-Interface, which is a well-established method during production to find hardware errors on a circuit design at an early stage during the manufacturing process. In contrast to boundary scan the BIST is implemented as a part of factory image in state of the art FPGA´s and could be activated by graphical user interface. Since the factory image part of the firmware will never be updated by consumers, the BIST is always available even if a previous application firmware update has been failed. This offers a comfortable customer service, because in case of any support questions hardware errors could be excluded before complex assistance for configurations and firmware updates begins.
Keywords :
built-in self test; control engineering computing; electronic engineering computing; embedded systems; field programmable gate arrays; firmware; graphical user interfaces; integrated circuit reliability; logic design; logic testing; telecontrol; BIST; FPGA based embedded systems; JTAG-interface; boundary scan testing; built-in self test; circuit design; comfortable customer service; consumers; factory image; firmware update; graphical user interface; hardware errors; manufacturing process; remote update controller; Built-in self-test; Circuit faults; Embedded systems; Field programmable gate arrays; Hardware; Microprogramming; Production facilities; Embedded System; Remote Update; Self Test;
Conference_Titel :
Consumer Electronics (ICCE), 2013 IEEE International Conference on
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4673-1361-2
DOI :
10.1109/ICCE.2013.6486994