DocumentCode :
1691385
Title :
1.7kV trench IGBT with deep and separate floating p-layer designed for low loss, low EMI noise, and high reliability
Author :
Watanabe, So ; Mori, Mutsuhiro ; Arai, Taiga ; Ishibashi, Kohsuke ; Toyoda, Yasushi ; Oda, Tetsuo ; Harada, Takashi ; Saito, Katsuaki
Author_Institution :
Hitachi Res. Lab., Hitachi Ltd., Hitachi, Japan
fYear :
2011
Firstpage :
48
Lastpage :
51
Abstract :
A novel 1.7kV IGBT with deep floating-p layers separated from trench gates has been developed to realize low loss, low EMI noise, and high reliability. Separating floating-p layers from the trench gates reduces excess VGE overshoot, which results in a 51% smaller reverse recovery dVAK/dt than the conventional IGBT. The deep floating p-layers weaken the electric field under the trenches, which results in an avalanche breakdown voltage of 2250V. In addition, the Eon + Eoff for the proposed structure can be reduced by 47% more than that of the conventional one, maintaining a low VCE(sat) of 2.3V at 125°C.
Keywords :
electromagnetic interference; insulated gate bipolar transistors; noise; reliability; 1.7kV trench IGBT; deep floating p-layer; high reliability; low EMI noise; separate floating p-layer; temperature 125 degC; trench gates; voltage 1.7 kV; voltage 2.3 V; Electric fields; Electromagnetic interference; Insulated gate bipolar transistors; Logic gates; Noise; Reliability; Resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices and ICs (ISPSD), 2011 IEEE 23rd International Symposium on
Conference_Location :
San Diego, CA
ISSN :
1943-653X
Print_ISBN :
978-1-4244-8425-6
Type :
conf
DOI :
10.1109/ISPSD.2011.5890787
Filename :
5890787
Link To Document :
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